Testing capability indices for manufacturing processes with asymmetric tolerance limits and measurement errors

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Testing capability indices for manufacturing processes with asymmetric tolerance limits and measurement errors

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In the manufacturing industry, many product characteristics are of one-sided tolerances. The process capability indices C p (u, v) and C l p(u, v) can be used to measure process performance. Most research work related to capability indices assumes no gauge measurement errors. This assumption insufficiently reflects real situations even when advanced measuring instruments are used. In this paper...

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ژورنال

عنوان ژورنال: International Journal of Metrology and Quality Engineering

سال: 2011

ISSN: 2107-6839,2107-6847

DOI: 10.1051/ijmqe/2011010